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RBS, AES and XPS analysis of ion beam induced nitridation of Si and SiGe alloys
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RBS, AES and XPS analysis of ion beam induced nitridation of Si and SiGe alloys
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Date
1994
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Coster, Walter
;
Brijs, Bert
;
Bender, Hugo
;
Alay, Josep Lluis
;
Vandervorst, Wilfried
Journal
Vacuum
Abstract
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33261
since deposited on 2021-09-29
2
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
33261
since deposited on 2021-09-29
2
last month
Acq. date: 2025-12-11
Citations