Publication:

Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformity

Date

2018

Journal article

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Files

38770.pdf 5.95 MB

Author(s)

Chiappe, Daniele

;

Ludwig, Jonathan

;

Leonhardt, Alessandra

;

El Kazzi, Salim

;

Nalin Mehta, Ankit

;

Nuytten, Thomas

;

Celano, Umberto

;

;

Pourtois, Geoffrey

;

;

Paredis, Kristof

;

Vandervorst, Wilfried

;

;

De Gendt, Stefan

;

;

Huyghebaert, Cedric

;

Asselberghs, Inge

;

Journal

Nanotechnology

Metrics

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