Publication:
LKE and BGI Lorentzian noise in strained and non-strained tri-gate SOI FinFETs with HfSiON/SiO2 gate dielectric
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1903 since deposited on 2021-10-19
Acq. date: 2025-10-25
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Views
1903 since deposited on 2021-10-19
Acq. date: 2025-10-25
Citations