Publication:
LKE and BGI Lorentzian noise in strained and non-strained tri-gate SOI FinFETs with HfSiON/SiO2 gate dielectric
Date
| dc.contributor.author | Lukyanchikova, N. | |
| dc.contributor.author | Garbar, N. | |
| dc.contributor.author | Kudina, V. | |
| dc.contributor.author | Smolanka, A. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-19T15:48:23Z | |
| dc.date.available | 2021-10-19T15:48:23Z | |
| dc.date.issued | 2011 | |
| dc.identifier.issn | 0038-1101 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19346 | |
| dc.source.beginpage | 27 | |
| dc.source.endpage | 36 | |
| dc.source.issue | 1 | |
| dc.source.journal | Solid-State Electronics | |
| dc.source.volume | 63 | |
| dc.title | LKE and BGI Lorentzian noise in strained and non-strained tri-gate SOI FinFETs with HfSiON/SiO2 gate dielectric | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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