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Reliability of AlGaN/GaN HEMTs: permanent leakage current increase and output current drop
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Reliability of AlGaN/GaN HEMTs: permanent leakage current increase and output current drop
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marcon, Denis
;
Viaene, John
;
Favia, Paola
;
Bender, Hugo
;
Kang, Xuanwu
;
Lenci, Silvia
;
Stoffels, Steve
;
Decoutere, Stefaan
Journal
Microelectronics Reliability
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Views
1925
since deposited on 2021-10-20
2
last month
1
last week
Acq. date: 2025-12-17
Citations