Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology

Publication:

2023

Journal article

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IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

207 since deposited on 2023-10-13

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Acq. date: 2026-02-24

832 since deposited on 2023-10-13

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Acq. date: 2026-02-24