Publication:
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology
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285 since deposited on 2023-10-13
36last month
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Acq. date: 2026-08-09
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844 since deposited on 2023-10-13
2last month
Acq. date: 2026-08-09
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