Publication:
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology
Loading...
Journal
Abstract
Description
Statistics
Downloads
304 since deposited on 2023-10-13
6last month
Acq. date: 2026-09-16
Views
847 since deposited on 2023-10-13
3last month
2last week
Acq. date: 2026-09-16
Citations
Statistics
Downloads
304 since deposited on 2023-10-13
6last month
Acq. date: 2026-09-16
Views
847 since deposited on 2023-10-13
3last month
2last week
Acq. date: 2026-09-16
Citations