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Demonstration of a submicron damascene Cu/low-k mechanical sensor to monitor stress in BEOL metallisation
Publication:
Demonstration of a submicron damascene Cu/low-k mechanical sensor to monitor stress in BEOL metallisation
Date
2009
Proceedings Paper
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17263.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wilson, Chris
;
Croes, Kristof
;
Tokei, Zsolt
;
Beyer, Gerald
;
Horsfall, Horsfall
;
O'Neill, Anthony G.
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Abstract
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1799
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1799
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations