Publication:
Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR)
| dc.contributor.author | Koegel, Michael | |
| dc.contributor.author | Brand, Sebastian | |
| dc.contributor.author | Grosse, Christian | |
| dc.contributor.author | Jacobs, Kristof J.P. | |
| dc.contributor.author | De Wolf, Ingrid | |
| dc.contributor.author | Altmann, Frank | |
| dc.contributor.imecauthor | Jacobs, Kristof J.P. | |
| dc.contributor.imecauthor | De Wolf, Ingrid | |
| dc.contributor.orcidext | Brand, Sebastian::0000-0003-1195-6326 | |
| dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
| dc.contributor.orcidimec | Jacobs, Kristof J.P.::0000-0002-1081-3633 | |
| dc.date.accessioned | 2023-08-08T10:08:17Z | |
| dc.date.available | 2023-06-20T10:39:43Z | |
| dc.date.available | 2023-08-08T10:08:17Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/CASE49439.2021.9551575 | |
| dc.identifier.eisbn | 978-1-6654-1873-7 | |
| dc.identifier.issn | 2161-8070 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42063 | |
| dc.publisher | IEEE | |
| dc.source.beginpage | 395 | |
| dc.source.conference | 17th IEEE International Conference on Automation Science and Engineering (CASE) | |
| dc.source.conferencedate | AUG 23-27, 2021 | |
| dc.source.conferencelocation | Lyon | |
| dc.source.endpage | 400 | |
| dc.source.journal | na | |
| dc.source.numberofpages | 6 | |
| dc.title | Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR) | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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