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Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques

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Acq. date: 2026-10-13

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Acq. date: 2026-10-13

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3 since deposited on 2023-03-27
Acq. date: 2026-10-13

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1070 since deposited on 2023-03-27
6last month
Acq. date: 2026-10-13

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