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Defect generation in ultra-thin SiO2 gate layers and SiO2/ZrO2 gate stacks and the dispersive transport model
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1940 since deposited on 2021-10-14
1last month
Acq. date: 2026-01-07
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Metrics
Views
1940 since deposited on 2021-10-14
1last month
Acq. date: 2026-01-07
Citations