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Complex admittance analysis for La2Hf2O7/SiO2 high-kappa dielectric stacks
Publication:
Complex admittance analysis for La2Hf2O7/SiO2 high-kappa dielectric stacks
Date
2004-01
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Apostolopoulos, G.
;
Vellianitis, G.
;
dimoulas, A.
;
Hooker, Jacob
;
Conard, Thierry
Journal
Applied Physics Letters
Abstract
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2020
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
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Views
2020
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations