Publication:
Complex admittance analysis for La2Hf2O7/SiO2 high-kappa dielectric stacks
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2023 since deposited on 2021-10-15
1last month
Acq. date: 2026-02-25
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2023 since deposited on 2021-10-15
1last month
Acq. date: 2026-02-25
Citations