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Characterisation of high-k containing nanolayers by reference-free X-ray fluorescence analysis with synchrotron radiation
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1887 since deposited on 2021-10-17
1last month
Acq. date: 2026-05-15
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Views
1887 since deposited on 2021-10-17
1last month
Acq. date: 2026-05-15
Citations