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Characterisation of high-k containing nanolayers by reference-free X-ray fluorescence analysis with synchrotron radiation
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1889 since deposited on 2021-10-17
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Acq. date: 2026-08-08
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1889 since deposited on 2021-10-17
2last month
2last week
Acq. date: 2026-08-08
Citations