Publication:

Scaled X-bar TiN/HfO2/TiN RRAM cells processed with optimised plasma enhanced atomic layer deposition (PEALD) for TiN electrode

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1918 since deposited on 2021-10-21
Acq. date: 2025-12-16

Citations

Metrics

Views

1918 since deposited on 2021-10-21
Acq. date: 2025-12-16

Citations