Publication:

Scaled X-bar TiN/HfO2/TiN RRAM cells processed with optimised plasma enhanced atomic layer deposition (PEALD) for TiN electrode

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1926 since deposited on 2021-10-21
2last month
2last week
Acq. date: 2026-09-17

Citations

Statistics

Views

1926 since deposited on 2021-10-21
2last month
2last week
Acq. date: 2026-09-17

Citations