Publication:
Field- and current-driven degradation of GaN-based power HEMTs with p-GaN gate: dependence on Mg-doping level
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1999 since deposited on 2021-10-24
2last month
Acq. date: 2026-01-10
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Metrics
Views
1999 since deposited on 2021-10-24
2last month
Acq. date: 2026-01-10
Citations