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Field- and current-driven degradation of GaN-based power HEMTs with p-GaN gate: dependence on Mg-doping level

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1997 since deposited on 2021-10-24
1last month
Acq. date: 2025-12-11

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1997 since deposited on 2021-10-24
1last month
Acq. date: 2025-12-11

Citations