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Atom probe analysis of a 3D-finfet with high-k metal gate
Publication:
Atom probe analysis of a 3D-finfet with high-k metal gate
Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gilbert, Matthieu
;
Vandervorst, Wilfried
;
Koelling, Sebastian
;
Kambham, Ajay Kumar
Journal
Ultramicroscopy
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1951
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations
Metrics
Views
1951
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations