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Conference contributions
SPM characterizaton of anomalies in phase shift mask and their effect on wafer features
Publication:
SPM characterizaton of anomalies in phase shift mask and their effect on wafer features
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Date
2001
Proceedings Paper
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5517.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Muckenhirn, S.
;
Meyyappan, A.
;
Walch, K.
;
Maslow, M.
;
Vandenberghe, Geert
;
van Wingerden, Johannes
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1851
since deposited on 2021-10-14
Acq. date: 2025-12-11
Citations
Metrics
Views
1851
since deposited on 2021-10-14
Acq. date: 2025-12-11
Citations