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Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?
Publication:
Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?
Date
2005
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kauerauf, Thomas
;
Degraeve, Robin
;
Zahid, Mohammed
;
Cho, Moon Ju
;
Kaczer, Ben
;
Roussel, Philippe
;
Groeseneken, Guido
;
Maes, Herman
;
De Gendt, Stefan
Journal
IEEE Electron Device Letters
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1916
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1916
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations