Publication:

Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?

Date

2005
Journal article
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dc.contributor.authorKauerauf, Thomas
dc.contributor.authorDegraeve, Robin
dc.contributor.authorZahid, Mohammed
dc.contributor.authorCho, Moon Ju
dc.contributor.authorKaczer, Ben
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.contributor.authorDe Gendt, Stefan
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.date.accessioned2021-10-16T02:28:01Z
dc.date.available2021-10-16T02:28:01Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10681
dc.source.beginpage773
dc.source.endpage775
dc.source.issue10
dc.source.journalIEEE Electron Device Letters
dc.source.volume26
dc.title

Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?

dc.typeJournal article
dspace.entity.typePublication
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