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In-line Metrology for Vertical Edge Placement Control of Monolithic CFET using CD-SEM
Publication:
In-line Metrology for Vertical Edge Placement Control of Monolithic CFET using CD-SEM
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Date
2023
Proceedings Paper
https://doi.org/10.1117/12.2656471
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sun, Wei
;
Doi, Ayumi
;
Isawa, Miki
;
Vega Gonzalez, Victor
;
Tokei, Zsolt
;
Lorusso, Gian
Journal
N/A
Abstract
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Metrics
Views
901
since deposited on 2023-07-28
5
last month
3
last week
Acq. date: 2025-12-12
Citations