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Conference contributions
A consistent model for the thickness dependence of intrinsic breakdown in ultra-thin oxides
Publication:
A consistent model for the thickness dependence of intrinsic breakdown in ultra-thin oxides
Date
1995
Proceedings Paper
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588.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Groeseneken, Guido
;
Bellens, Rudi
;
Depas, Michel
;
Maes, Herman
Journal
Abstract
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2095
since deposited on 2021-09-29
Acq. date: 2025-10-22
Citations
Metrics
Views
2095
since deposited on 2021-09-29
Acq. date: 2025-10-22
Citations