Publication:
Evidence of hot-electron degradation in GaN-based MIS-HEMTs submitted to high temperature constant source current stress
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1979 since deposited on 2021-10-23
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Acq. date: 2026-08-06
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Statistics
Views
1979 since deposited on 2021-10-23
2last month
1last week
Acq. date: 2026-08-06
Citations