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Effects of pre-amorphization implantation (PAI) in ultra shallow junctions formed by SPER in deep sub-micron devices
Publication:
Effects of pre-amorphization implantation (PAI) in ultra shallow junctions formed by SPER in deep sub-micron devices
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Date
2004-01
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Severi, Simone
;
Henson, Kirklen
;
Lindsay, Richard
;
De Meyer, Kristin
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Abstract
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Downloads
1
since deposited on 2021-10-15
Acq. date: 2026-03-16
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1855
since deposited on 2021-10-15
1
last month
Acq. date: 2026-03-17
Citations