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Reliability sssessment of integrated power transistors: lateral DMOS versus vertical DMOS
Publication:
Reliability sssessment of integrated power transistors: lateral DMOS versus vertical DMOS
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Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Moens, Peter
;
Van den Bosch, Geert
Journal
Microelectronics Reliability
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Views
1896
since deposited on 2021-10-17
1
last month
1
last week
Acq. date: 2025-12-15
Citations