Publication:
Reliability sssessment of integrated power transistors: lateral DMOS versus vertical DMOS
Date
| dc.contributor.author | Moens, Peter | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Moens, Peter | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.date.accessioned | 2021-10-17T09:07:29Z | |
| dc.date.available | 2021-10-17T09:07:29Z | |
| dc.date.issued | 2008 | |
| dc.identifier.issn | 0026-2714 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14182 | |
| dc.source.beginpage | 1300 | |
| dc.source.endpage | 13005 | |
| dc.source.issue | 8_9 | |
| dc.source.journal | Microelectronics Reliability | |
| dc.source.volume | 48 | |
| dc.title | Reliability sssessment of integrated power transistors: lateral DMOS versus vertical DMOS | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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