Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
FinFETs junctions optimization by conventional ion implantation for (sub-)22nm technology nodes circuit applications
Publication:
FinFETs junctions optimization by conventional ion implantation for (sub-)22nm technology nodes circuit applications
Copy permalink
Date
2010-09
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Veloso, Anabela
;
De Keersgieter, An
;
Brus, Stephan
;
Horiguchi, Naoto
;
Absil, Philippe
;
Hoffmann, Thomas Y.
Journal
Abstract
Description
Metrics
Views
1785
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1785
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-15
Citations