Publication:
Two-dimensional carrier mapping at the nanometerscale on 32nm node targeted p-MOSFETs using high vacuum scanning spreading resistance microscopy
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1907 since deposited on 2021-10-20
1last month
Acq. date: 2025-12-17
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Views
1907 since deposited on 2021-10-20
1last month
Acq. date: 2025-12-17
Citations