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EUV Single Patterning Exploration for Pitch 28 nm
Publication:
EUV Single Patterning Exploration for Pitch 28 nm
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Date
2021-02-22
Proceedings Paper
https://doi.org/10.1117/12.2584730
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xu, Dongbo
;
Gillijns, Werner
;
Drissi, Youssef
;
Tan, Ling Ee
;
Oak, Apoorva
;
Kim, Ryan Ryoung han
Journal
SPIE paper
Abstract
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174
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Acq. date: 2025-12-11
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1675
since deposited on 2021-11-02
Acq. date: 2025-12-11
Citations
Metrics
Downloads
174
since deposited on 2021-11-02
26
last month
5
last week
Acq. date: 2025-12-11
Views
1675
since deposited on 2021-11-02
Acq. date: 2025-12-11
Citations