Publication:

Process-induced charging damage in IGZO nTFTs

Date

2021

Proceedings Paper

https://doi.org/10.1109/IRPS46558.2021.9405201

Simple item page Full metadata Statistics

Author(s)

Hiblot, Gaspard

;

Rassoul, Nouredine

;

;

Devriendt, Katia

;

Vaisman Chasin, Adrian

;

van Setten, Michiel

;

Belmonte, Attilio

;

Delhougne, Romain

;

Kar, Gouri Sankar

Journal

na

Metrics

1826 since deposited on 2022-03-11

1last month

Acq. date: 2025-12-15