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Study on photoelectricity properties of SiCN thin films prepared by magnetron sputtering

 
dc.contributor.authorLi, Qiang
dc.contributor.authorChen, Cheng
dc.contributor.authorWang, Mingge
dc.contributor.authorLv, Yaohui
dc.contributor.authorMao, Yulu
dc.contributor.authorXu, Manzhang
dc.contributor.authorWang, Yingnan
dc.contributor.authorWang, Xuewen
dc.contributor.authorZhang, Zhiyong
dc.contributor.authorWang, Shouguo
dc.contributor.authorZhao, Wu
dc.contributor.authorStiens, Johan
dc.contributor.imecauthorStiens, Johan
dc.date.accessioned2022-06-16T12:14:23Z
dc.date.available2022-01-02T02:06:29Z
dc.date.available2022-06-16T12:14:23Z
dc.date.issued2021
dc.identifier.doi10.1016/j.jmrt.2021.08.043
dc.identifier.issn2238-7854
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38705
dc.publisherELSEVIER
dc.source.beginpage460
dc.source.endpage467
dc.source.issuena
dc.source.journalJOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T
dc.source.numberofpages8
dc.source.volume15
dc.subject.keywordsAMORPHOUS-SILICON
dc.title

Study on photoelectricity properties of SiCN thin films prepared by magnetron sputtering

dc.typeJournal article
dspace.entity.typePublication
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