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Study on memory characteristics of fin-shaped feedback field effect transistor
Publication:
Study on memory characteristics of fin-shaped feedback field effect transistor
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Date
2022
Journal article
https://doi.org/10.1088/1361-6641/ac643e
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Han, Shinick
;
Kim, Younghyun
;
Son, Donghee
;
Baac, Hyoung Won
;
Won, Sang Min
;
Shin, Changhwan
Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
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1831
since deposited on 2022-05-02
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Acq. date: 2025-12-15
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Metrics
Views
1831
since deposited on 2022-05-02
1
last month
Acq. date: 2025-12-15
Citations