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The enhanced degradation of MOSFETs damaged by hot holes
Publication:
The enhanced degradation of MOSFETs damaged by hot holes
Date
1996
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Al-Kofahi, I. S.
;
Zhang, Jenny
;
Groeseneken, Guido
Journal
Abstract
Description
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1857
since deposited on 2021-09-29
411
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Acq. date: 2025-10-24
Citations
Metrics
Views
1857
since deposited on 2021-09-29
411
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations