Publication:
The enhanced degradation of MOSFETs damaged by hot holes
Date
| dc.contributor.author | Al-Kofahi, I. S. | |
| dc.contributor.author | Zhang, Jenny | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-09-29T14:15:55Z | |
| dc.date.available | 2021-09-29T14:15:55Z | |
| dc.date.issued | 1996 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1051 | |
| dc.source.beginpage | 711 | |
| dc.source.conference | Proceedings of the Third International Symposium on the Physics and Chemistry of SiO2 and the SiO2 Interface; May 5-10, 1996. Lo | |
| dc.source.conferencelocation | ||
| dc.source.endpage | 721 | |
| dc.title | The enhanced degradation of MOSFETs damaged by hot holes | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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