Publication:

Relation between trap creation and breakdown during tunnelling current stressing of sub 3nm gate oxide

Date

Loading...
Thumbnail Image

Journal

Abstract

Description

Metrics

Views

1846 since deposited on 2021-09-30
2last month
Acq. date: 2025-12-16

Citations

Metrics

Views

1846 since deposited on 2021-09-30
2last month
Acq. date: 2025-12-16

Citations