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Conference contributions
HREM characterization of oxygen ion beam sputtered epitaxial CoSi2
Publication:
HREM characterization of oxygen ion beam sputtered epitaxial CoSi2
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Date
1994
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bender, Hugo
;
De Coster, Walter
;
Brijs, Bert
;
Alay, Josep Lluis
;
Vandervorst, Wilfried
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33286
since deposited on 2021-09-29
Acq. date: 2025-12-11
Citations
Metrics
Views
33286
since deposited on 2021-09-29
Acq. date: 2025-12-11
Citations