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3D measurement of 3D NAND memory hole with CD-SEM and tilted FIB
Publication:
3D measurement of 3D NAND memory hole with CD-SEM and tilted FIB
Date
2017
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ohashi, Takeyoshi
;
Yamaguchi, Atsuko
;
Hasumi, Kazuhisa
;
Ikota, Masami
;
Tan, Chi Lim
;
Raymaekers, Tom
;
Van den Bosch, Geert
;
Furnemont, Arnaud
;
Lorusso, Gian
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2208
since deposited on 2021-10-24
Acq. date: 2025-10-22
Citations
Metrics
Views
2208
since deposited on 2021-10-24
Acq. date: 2025-10-22
Citations