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CAD-based defect inspection with optimal ROI selection based on polychromatic X-ray projection images
Publication:
CAD-based defect inspection with optimal ROI selection based on polychromatic X-ray projection images
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Date
2019
Proceedings Paper
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40307.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Presenti, Alice
;
Sijbers, Jan
;
den Dekker, Arnold J.
;
De Beenhouwer, Jan
Journal
Abstract
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2076
since deposited on 2021-10-27
Acq. date: 2025-12-12
Citations
Metrics
Views
2076
since deposited on 2021-10-27
Acq. date: 2025-12-12
Citations