CAD-based defect inspection with optimal ROI selection based on polychromatic X-ray projection images

dc.contributor.author	Presenti, Alice
dc.contributor.author	Sijbers, Jan
dc.contributor.author	den Dekker, Arnold J.
dc.contributor.author	De Beenhouwer, Jan
dc.contributor.imecauthor	Presenti, Alice
dc.contributor.imecauthor	Sijbers, Jan
dc.contributor.imecauthor	De Beenhouwer, Jan
dc.contributor.orcidimec	Sijbers, Jan::0000-0003-4225-2487
dc.contributor.orcidimec	De Beenhouwer, Jan::0000-0001-5253-1274
dc.date.accessioned	2021-10-27T16:21:58Z
dc.date.available	2021-10-27T16:21:58Z
dc.date.embargo	9999-12-31
dc.date.issued	2019
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/33825
dc.identifier.url	https://visielab.uantwerpen.be/sites/default/files/abstract_ict2019_ap_29062018.pdf
dc.source.beginpage	1
dc.source.conference	9th International Conference on Industrial Computed Tomography - iCT
dc.source.conferencedate	13/02/2019
dc.source.conferencelocation	Padova Italy
dc.source.endpage	2
dc.title	CAD-based defect inspection with optimal ROI selection based on polychromatic X-ray projection images
dc.type	Proceedings paper
dspace.entity.type	Publication
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