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Reliability of a DME Ru Semidamascene scheme with 16 nm wide Airgaps
Publication:
Reliability of a DME Ru Semidamascene scheme with 16 nm wide Airgaps
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Date
2021
Proceedings Paper
https://doi.org/10.1109/IRPS46558.2021.9405192
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lesniewska, Alicja
;
Varela Pedreira, Olalla
;
Lofrano, Melina
;
Murdoch, Gayle
;
van der Veen, Marleen
;
Dangol, Anish
;
Horiguchi, Naoto
;
Tokei, Zsolt
;
Croes, Kristof
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na
Abstract
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Acq. date: 2025-12-15
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Views
1893
since deposited on 2022-03-11
1
last month
1
last week
Acq. date: 2025-12-15
Citations