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Integrated diffusion - recombination model for describing the logarithmic time dependence of plasma damage in porous low-k materials
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Integrated diffusion - recombination model for describing the logarithmic time dependence of plasma damage in porous low-k materials
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Date
2010
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20308.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kunnen, Eddy
;
Barkema, Gerard
;
Maes, Christian
;
Shamiryan, Denis
;
Urbanowicz, Adam
;
Struyf, Herbert
;
Baklanov, Mikhaïl
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1789
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Acq. date: 2025-12-12
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Views
1789
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-12
Citations