Publication:
Direct Assessment of Defective Regions in Monolayer MoS<sub>2</sub> Field-Effect Transistors through <i>In Situ</i> Scanning Probe Microscopy Measurements
Loading...
Journal
Abstract
Description
Statistics
Views
574 since deposited on 2024-04-07
1last month
Acq. date: 2026-01-27
Citations
Statistics
Views
574 since deposited on 2024-04-07
1last month
Acq. date: 2026-01-27
Citations