Effects of Back-Gate Bias on the Mobility and Reliability of Junction-Less FDSOI Transistors for 3-D Sequential Integration

Publication:

2021

Journal article

Author(s)

;

;

;

;

;

;

;

IEEE TRANSACTIONS ON ELECTRON DEVICES

1812 since deposited on 2022-03-02

2last month

Acq. date: 2025-12-17