Publication:
Elastic strain in In0.18Ga0.82N layer: a combined x-ray diffraction and Rutherford backscattering/channeling study
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2020 since deposited on 2021-10-14
3last month
Acq. date: 2026-04-27
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Statistics
Views
2020 since deposited on 2021-10-14
3last month
Acq. date: 2026-04-27
Citations