Publication:
Elastic strain in In0.18Ga0.82N layer: a combined x-ray diffraction and Rutherford backscattering/channeling study
Date
| dc.contributor.author | Wu, Ming Fang | |
| dc.contributor.author | Vantomme, Andre | |
| dc.contributor.author | Hogg, S. M. | |
| dc.contributor.author | Langouche, G. | |
| dc.contributor.author | Van der Stricht, Wim | |
| dc.contributor.author | Jacobs, Koen | |
| dc.contributor.author | Moerman, Ingrid | |
| dc.contributor.imecauthor | Vantomme, Andre | |
| dc.contributor.imecauthor | Moerman, Ingrid | |
| dc.contributor.orcidimec | Moerman, Ingrid::0000-0003-2377-3674 | |
| dc.date.accessioned | 2021-10-14T11:58:49Z | |
| dc.date.available | 2021-10-14T11:58:49Z | |
| dc.date.issued | 1999 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4037 | |
| dc.source.beginpage | 365 | |
| dc.source.endpage | 367 | |
| dc.source.issue | 3 | |
| dc.source.journal | Appl. Phys. Lett. | |
| dc.source.volume | 74 | |
| dc.title | Elastic strain in In0.18Ga0.82N layer: a combined x-ray diffraction and Rutherford backscattering/channeling study | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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