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Conference contributions
Thickness dependence and annealing behavior of Pt-group metal thin films as alternative metals for advanced interconnects
Publication:
Thickness dependence and annealing behavior of Pt-group metal thin films as alternative metals for advanced interconnects
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Date
2016
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Dutta, Shibesh
;
Opsomer, Karl
;
Hoque, Anamul
;
Peeters, Kristof
;
Richard, Olivier
;
Detavernier, Christophe
;
Van Elshocht, Sven
;
Boemmels, Juergen
;
Tokei, Zsolt
;
Vandervorst, Wilfried
;
Adelmann, Christoph
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Statistics
Views
1832
since deposited on 2021-10-23
1
last month
Acq. date: 2026-02-24
Citations