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A 3D electrical characterization of single stacking faults in InP by conductive-AFM
Publication:
A 3D electrical characterization of single stacking faults in InP by conductive-AFM
Date
2015
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mannarino, Manuel
;
Celano, Umberto
;
Lu, Augustin
;
Chintala, Ravi Chandra
;
Paredis, Kristof
;
Vandervorst, Wilfried
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Abstract
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2006
since deposited on 2021-10-22
425
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Acq. date: 2025-10-24
Citations
Metrics
Views
2006
since deposited on 2021-10-22
425
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations