Publication:

A 3D electrical characterization of single stacking faults in InP by conductive-AFM

Date

2015
Meeting abstract
Simple item page Full metadata Statistics
 
dc.contributor.authorMannarino, Manuel
dc.contributor.authorCelano, Umberto
dc.contributor.authorLu, Augustin
dc.contributor.authorChintala, Ravi Chandra
dc.contributor.authorParedis, Kristof
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorMannarino, Manuel
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.date.accessioned2021-10-22T20:50:47Z
dc.date.available2021-10-22T20:50:47Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25604
dc.source.beginpageUU8.05
dc.source.conference2015 MRS Fall Meeting symposium UU:
dc.source.conferencedate29/11/2015
dc.source.conferencelocationBoston, MA USA
dc.title

A 3D electrical characterization of single stacking faults in InP by conductive-AFM

dc.typeMeeting abstract
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions