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Gate oxide breakdown in FET devices and circuits: from nanoscale physics to system-level reliability
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Acq. date: 2026-03-01
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Acq. date: 2026-03-01
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1 since deposited on 2021-10-16
Acq. date: 2026-03-01
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1851 since deposited on 2021-10-16
1last month
1last week
Acq. date: 2026-03-01
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