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Thermal cycling reliability of SnAgCu and SnPb solder joints: a comparison of for several IC-packages
Publication:
Thermal cycling reliability of SnAgCu and SnPb solder joints: a comparison of for several IC-packages
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Date
2004-05
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandevelde, Bart
;
Gonzalez, Mario
;
Limaye, Paresh
;
Ratchev, Petar
;
Beyne, Eric
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1879
since deposited on 2021-10-15
Acq. date: 2025-12-16
Citations
Metrics
Views
1879
since deposited on 2021-10-15
Acq. date: 2025-12-16
Citations