Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETs

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Author(s)

Panarella, Luca

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Tyaginov, Stanislav

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Makarov, Alexander

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Lockhart de la Rosa, Cesar Javier

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Kar, Gouri Sankar

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Afanasiev, Valeri

Journal

ACS APPLIED MATERIALS & INTERFACES

Metrics

262 since deposited on 2024-11-10

Acq. date: 2025-10-23