Publication:
Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETs
| dc.contributor.author | Panarella, Luca | |
| dc.contributor.author | Tyaginov, Stanislav | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Smets, Quentin | |
| dc.contributor.author | Verreck, Devin | |
| dc.contributor.author | Makarov, Alexander | |
| dc.contributor.author | Schram, Tom | |
| dc.contributor.author | Lin, Dennis | |
| dc.contributor.author | Lockhart de la Rosa, Cesar Javier | |
| dc.contributor.author | Kar, Gouri Sankar | |
| dc.contributor.author | Afanasiev, Valeri | |
| dc.contributor.imecauthor | Panarella, Luca | |
| dc.contributor.imecauthor | Tyaginov, Stanislav | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Smets, Quentin | |
| dc.contributor.imecauthor | Verreck, Devin | |
| dc.contributor.imecauthor | Makarov, Alexander | |
| dc.contributor.imecauthor | Schram, Tom | |
| dc.contributor.imecauthor | Lin, Dennis | |
| dc.contributor.imecauthor | Lockhart de la Rosa, Cesar Javier | |
| dc.contributor.imecauthor | Kar, Gouri Sankar | |
| dc.contributor.imecauthor | Afanasiev, Valeri | |
| dc.contributor.orcidimec | Tyaginov, Stanislav::0000-0002-5348-2096 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Smets, Quentin::0000-0002-2356-5915 | |
| dc.contributor.orcidimec | Verreck, Devin::0000-0002-3833-5880 | |
| dc.contributor.orcidimec | Makarov, Alexander::0000-0002-9927-6511 | |
| dc.contributor.orcidimec | Schram, Tom::0000-0003-1533-7055 | |
| dc.contributor.orcidimec | Lin, Dennis::0000-0002-1577-6050 | |
| dc.contributor.orcidimec | Lockhart de la Rosa, Cesar Javier::0000-0002-1401-0141 | |
| dc.contributor.orcidimec | Afanasiev, Valeri::0000-0001-5018-4539 | |
| dc.date.accessioned | 2025-04-03T08:59:33Z | |
| dc.date.available | 2024-11-10T17:04:20Z | |
| dc.date.available | 2025-04-03T08:59:33Z | |
| dc.date.issued | 2024 | |
| dc.description.wosFundingText | This work was done in the imec IIAP core CMOS programs and supported by The Research FoundationFlanders (FWO Grant 1S72625N). Fundings were received from the European Union's Horizon 2020 research and innovation program under Grant Agreement 952792 (2D-EPL). | |
| dc.identifier.doi | 10.1021/acsami.4c10888 | |
| dc.identifier.issn | 1944-8244 | |
| dc.identifier.pmid | MEDLINE:39465649 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44770 | |
| dc.publisher | AMER CHEMICAL SOC | |
| dc.source.beginpage | 62314 | |
| dc.source.endpage | 62325 | |
| dc.source.issue | 45 | |
| dc.source.journal | ACS APPLIED MATERIALS & INTERFACES | |
| dc.source.numberofpages | 12 | |
| dc.source.volume | 16 | |
| dc.subject.keywords | ATOMIC LAYER DEPOSITION | |
| dc.subject.keywords | FIELD-EFFECT TRANSISTORS | |
| dc.subject.keywords | 2-DIMENSIONAL MATERIALS | |
| dc.subject.keywords | AL2O3 | |
| dc.subject.keywords | SILICON | |
| dc.subject.keywords | GATE | |
| dc.subject.keywords | HETEROSTRUCTURES | |
| dc.subject.keywords | PERFORMANCE | |
| dc.title | Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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